Published November 2018 | Version v1
Journal article

Electronic excitation effects on Fe2O3 films by high-energy ions

  • 1. School of Engineering, Nagoya University, Nagoya 464-8603 (Japan)
  • 2. Japan Atomic Energy Agency (JAEA), Tokai 319-1195 (Japan)

Description

For better understanding of electronic excitation effects on materials with small bandgap, we have extended measurements to Fe2O3 (hematite) films. Applying carbon-foil (100 nm)-collector method, we have measured amounts of Fe in the C-collector as a function of fluence of 198 MeV Xe, 99 MeV Xe and 89 MeV Ni ions with the equilibrium charge. From the slope of Fe amount vs ion fluence with the efficiency fc of C-collector (0.3), sputtering yields Y are obtained to be 81.7, 57.9 and 38.3 by these ions, assuming stoichiometric sputtering. It appears that the sputtering yields are much larger than the calculated sputtering yields based on the elastic collisions. We have obtained Y = BSen with n = 1.25 and B = 1.2, Se being the electronic stopping powers (keV/nm). Optical direct bandgap is obtained to be 2.6 eV. The present Fe2O3 results are found to be within the bandgap scheme. Also, we have studied modifications of atomic structure using X-ray diffraction and optical absorption. Electronic excitation effects on modifications of these properties are described and compared with low-energy ion, 100 keV Ne ion impact. A mechanism is discussed for electron-lattice coupling.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2018.05.029

Additional details

Identifiers

DOI
10.1016/j.nimb.2018.05.029;
PII
S0168583X18303446;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
435
Journal Page Range
p. 142-145
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
19. International Conference on Radiation Effects in Insulators
Acronym
REI-19
Dates
2-7 Jul 2017
Place
Versailles (France)

Optional Information

Copyright
Copyright (c) 2018 Elsevier B.V. All rights reserved.