NiFe epitaxial films with hcp and fcc structures prepared on bcc-Cr underlayers
- 1. Faculty of Science and Engineering, Chuo University, 1-13-27 Kasuga, Bunkyo-ku, Tokyo 112-8551 (Japan)
- 2. Graduate School of Fine Arts, Tokyo National University of Fine Arts and Music, 12-8 Ueno-koen, Taito-ku, Tokyo 110-8714 (Japan)
Description
NiFe epitaxial films are prepared on Cr(211)bcc and Cr(100)bcc underlayers grown hetero-epitaxially on MgO single-crystal substrates by ultra-high vacuum rf magnetron sputtering. The film growth behavior and the crystallographic properties are studied by reflection high energy electron diffraction and pole figure X-ray diffraction. Metastable hcp-NiFe(11-bar 00) and hcp-NiFe(112-bar 0) crystals respectively nucleate on Cr(211)bcc and Cr(100)bcc underlayers, where the hcp-NiFe crystals are stabilized through hetero-epitaxial growth. The hcp-NiFe(11-bar 00) crystal is a single-crystal with the c-axis parallel to the substrate surface, whereas the hcp-NiFe(112-bar 0) crystal is a bi-crystal with the respective c-axes lying in plane and perpendicular each other. With increasing the film thickness, the hcp structure in the NiFe films starts to transform into more stable fcc structure by atomic displacement parallel to the hcp(0001) close packed plane. The resulting films consist of hcp and fcc crystals.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.03.066Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.03.066;
- PII
- S0040-6090(11)00722-X;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 519
- Journal Issue
- 23
- Journal Page Range
- p. 8347-8350
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 1. international conference of the Asian Union of Magnetics Societies
- Acronym
- ICAUMS 2010
- Dates
- 5-8 Dec 2010
- Place
- Jeju Island (Korea, Republic of)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43052250
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC DISPLACEMENTS; BCC LATTICES; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; EPITAXY; FCC LATTICES; HCP LATTICES; MAGNESIUM OXIDES; MAGNETRONS; MONOCRYSTALS; REFLECTION; SPUTTERING; SUBSTRATES; THICKNESS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; CUBIC LATTICES; DIFFRACTION; DIMENSIONS; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; HEXAGONAL LATTICES; MAGNESIUM COMPOUNDS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.