Published July 2016
| Version v1
Journal article
Design of readout chip for silicon pixel detector
- 1. University of Chinese Academy of Sciences, Beijing (China)
- 2. Institute of High Energy Physics, Chinese Academy of Sciences, Beijing (China)
- 3. State Key Laboratory of Particle Detection and Electronics, Beijing (China)
Description
A readout chip based on the time over threshold technology was designed for silicon pixel detector used in high energy physics experiment. The chip was taped out with a 130 nm CMOS technology. There are 30 × 10 pixel units in one chip, and the size of one pixel unit is 50 μm × 250 μm. Test results show that the equivalent input noise of the pixel unit circuit is less than 100e- and the integral non-linearity is better than 4.2%. The basic functions are realized. (authors)
Additional details
Identifiers
Publishing Information
- Journal Title
- Atomic Energy Science and Technology
- Journal Volume
- 50
- Journal Issue
- 7
- Journal Page Range
- p. 1296-1300
- ISSN
- 1000-6931
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 50026148
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DESIGN; HIGH ENERGY PHYSICS; NOISE; RADIATION DETECTORS; READOUT SYSTEMS; SILICON
- Descriptors DEC
- ELEMENTS; MEASURING INSTRUMENTS; PHYSICS; SEMIMETALS
Optional Information
- Notes
- 8 figs., 11 refs.; http://dx.doi.org/10.7538/yzk.2016.50.07.1296