Published July 2016 | Version v1
Journal article

Design of readout chip for silicon pixel detector

  • 1. University of Chinese Academy of Sciences, Beijing (China)
  • 2. Institute of High Energy Physics, Chinese Academy of Sciences, Beijing (China)
  • 3. State Key Laboratory of Particle Detection and Electronics, Beijing (China)

Description

A readout chip based on the time over threshold technology was designed for silicon pixel detector used in high energy physics experiment. The chip was taped out with a 130 nm CMOS technology. There are 30 × 10 pixel units in one chip, and the size of one pixel unit is 50 μm × 250 μm. Test results show that the equivalent input noise of the pixel unit circuit is less than 100e- and the integral non-linearity is better than 4.2%. The basic functions are realized. (authors)

Additional details

Identifiers

Publishing Information

Journal Title
Atomic Energy Science and Technology
Journal Volume
50
Journal Issue
7
Journal Page Range
p. 1296-1300
ISSN
1000-6931

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
50026148
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
DESIGN; HIGH ENERGY PHYSICS; NOISE; RADIATION DETECTORS; READOUT SYSTEMS; SILICON
Descriptors DEC
ELEMENTS; MEASURING INSTRUMENTS; PHYSICS; SEMIMETALS

Optional Information

Notes
8 figs., 11 refs.; http://dx.doi.org/10.7538/yzk.2016.50.07.1296