Published October 27, 2014 | Version v1
Journal article

Studying fringe field effect of a field emitter array

  • 1. Saint Petersburg State University, 7-9, Universitetskaya nab., St. Petersburg, 199034 (Russian Federation)

Description

Field emitter arrays on heavy As-doped Si wafer are studied in vacuum nanoelectronics diode configuration. Different shapes of emitters are considered: cone-shaped point-emitters and cylinder-shaped sharp-edge-emitters are compared. Micro scale field enhancement factor on the edge of cylindrical emitter was calculated via home-developed Matlab application and the results are presented. Two types of anode geometry are proposed: plane anode and spherical anode. Experimental and modelling results of surface electric field distribution are presented. The spherical shape of anode allows higher voltage (and higher field emission current) without destructive arcs risk

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/541/1/012020

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
541
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
1. international school and conference on optoelectronics, photonics, engineering and nanostructures
Acronym
OPEN 2014
Dates
25-27 Mar 2014
Place
St Petersburg (Russian Federation)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46082575
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANODES; COMPUTERIZED SIMULATION; CONES; CYLINDRICAL CONFIGURATION; DOPED MATERIALS; ELECTRIC FIELDS; ELECTRIC POTENTIAL; FIELD EMISSION; NANOELECTRONICS; SHAPE; SILICON; SPHERICAL CONFIGURATION; SURFACES
Descriptors DEC
CONFIGURATION; ELECTRODES; ELEMENTS; EMISSION; MATERIALS; SEMIMETALS; SIMULATION