Integration of the PIXE and XRF spectrometries for simultaneous applications
- 1. Laboratory for Science and Technology in Art, Academy of Fine Arts, Zagreb (Croatia)
- 2. Ruder Boskovic Institute, Laboratory for Ion Beam Interactions, Zagreb (Croatia)
Description
Within this CRP two nuclear spectroscopic methods, PIXE and XRF, were integrated into a single set-up and the unification of techniques was investigated. For that purpose the vacuum chamber of the PIXE line of the IAEA experimental line at the Rudjer Boskovic Institute in Zagreb was used. A new chamber top flange was constructed, which allowed mounting of a small, low power X ray tube within the chamber. Parameters for achieving optimal signal to noise ratio of the X ray fluorescence from typical soil samples were determined for this set up. The benefits of this CRP were twofold. Firstly, by using the detection system and the positioning mechanism of the existing PIXE line, a fully operational XRF system was acquired without much further investment. This allows material characterization measurements when the ion beams from the accelerator are not available. Secondly, this integration exploits the complementarities of the two methods, and by broadening the sensitivity for low and high Z elements depending on the method used, it allows even wider elemental characterization of a sample under investigation. (author)
Additional details
Identifiers
Publishing Information
- ISBN
- 978-92-0-121310-5
- Imprint Title
- Integration of nuclear spectrometry methods as a new approach to material research. Final report of a coordinated research project 2006-2009
- Imprint Pagination
- 157 p.
- Journal Page Range
- p. 57-65
- ISSN
- 1011-4289
- Report number
- IAEA-TECDOC--1669
INIS
- Country of Publication
- International Atomic Energy Agency (IAEA)
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43021131
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCELERATORS; DETECTION; FLUORESCENCE; IAEA; ION BEAMS; PIXE ANALYSIS; POSITIONING; SENSITIVITY; SIGNAL-TO-NOISE RATIO; SOILS; SPECTROSCOPY; X RADIATION; X-RAY FLUORESCENCE ANALYSIS; X-RAY TUBES
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; DIMENSIONLESS NUMBERS; ELECTROMAGNETIC RADIATION; ELECTRON TUBES; EMISSION; EQUIPMENT; INTERNATIONAL ORGANIZATIONS; IONIZING RADIATIONS; LUMINESCENCE; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATIONS; X-RAY EMISSION ANALYSIS; X-RAY EQUIPMENT
Optional Information
- Notes
- 6 refs, 9 figs, 1 tab