Characterization of thin-film optics and materials for power lasers

This document presents several studies on thin films and optical materials that have been carried out to improve their performance with regard to their applications on power laser channels developed by the CEA. These studies involve the establishment of characterization means and sometimes specific calculation codes. Optical materials and thin layers are analyzed according to their spectral, angular or temporal properties, sometimes under laser power. The initial basis is the perfect knowledge of the n, k and e of the elementary layer. The total losses of these components are measured as well as their different contributors, in particular absorption and scattering for allowing an overall optimization of these components. Stresses are highlighted and measured to sometimes compensate for their effects or explain the behaviors observed on laser damage. Damage is the main theme of this manuscript, which shows its multiparameter side involving sometimes significant differences between laboratories. The main differences are related to uncertainties, the analytical beams and means and the heterogeneities of the tested components. (author)