Published November 1, 2014 | Version v1
Journal article

Pixel-level A/D conversion using voltage reset technique

  • 1. Institute of Microelectronics, Tsinghua University, Beijing 100084 (China)

Description

This paper presents a 50 Hz 15-bit analog-to-digital converter (ADC) for pixel-level implementation in CMOS image sensors. The ADC is based on charge packets counting and adopts a voltage reset technique to inject charge packets. The core circuit for charge/pulse conversion is specially optimized for low power, low noise and small area. An experimental chip with ten pixel-level ADCs has been fabricated and tested for verification. The measurement result shows a standard deviation of 1.8 LSB for full-scale output. The ADC has an area of 45 × 45 μm2 and consumes less than 2 μW in a standard 1P-6M 0.18 μm CMOS process. (semiconductor integrated circuits)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/35/11/115009

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
35
Journal Issue
11
Journal Page Range
[5 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47018567
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANALOG-TO-DIGITAL CONVERTERS; CONVERSION; ELECTRIC POTENTIAL; IMAGES; INTEGRATED CIRCUITS; PULSES; SEMICONDUCTOR MATERIALS; SENSORS
Descriptors DEC
ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; MATERIALS; MICROELECTRONIC CIRCUITS