Published November 1, 2014
| Version v1
Journal article
Pixel-level A/D conversion using voltage reset technique
Creators
- 1. Institute of Microelectronics, Tsinghua University, Beijing 100084 (China)
Description
This paper presents a 50 Hz 15-bit analog-to-digital converter (ADC) for pixel-level implementation in CMOS image sensors. The ADC is based on charge packets counting and adopts a voltage reset technique to inject charge packets. The core circuit for charge/pulse conversion is specially optimized for low power, low noise and small area. An experimental chip with ten pixel-level ADCs has been fabricated and tested for verification. The measurement result shows a standard deviation of 1.8 LSB for full-scale output. The ADC has an area of 45 × 45 μm2 and consumes less than 2 μW in a standard 1P-6M 0.18 μm CMOS process. (semiconductor integrated circuits)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/35/11/115009Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 35
- Journal Issue
- 11
- Journal Page Range
- [5 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47018567
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANALOG-TO-DIGITAL CONVERTERS; CONVERSION; ELECTRIC POTENTIAL; IMAGES; INTEGRATED CIRCUITS; PULSES; SEMICONDUCTOR MATERIALS; SENSORS
- Descriptors DEC
- ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; MATERIALS; MICROELECTRONIC CIRCUITS