Published 1987 | Version v1
Report Restricted

Decrease of the presence of defects in GaAs(Si,Sn) epitaxial films and improvement on electric-physical and spectrometric parameters of radiation Si detectors under positron irradiation

Creators

  • 1. Academy of Sciences of Siberian Branch USSR, Tomsk. Inst. of Physics of Hardness and Materials
  • 2. Tomskij Politekhnicheskij Inst. (USSR). Inst. Yadernoj Fiziki, Ehlektroniki i Avtomatiki

Description

no abstract available

Files

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Additional details

Publishing Information

Imprint Title
Proceedings of the European Meeting on Studies of Defects
Imprint Pagination
191 p.
Journal Page Range
p. I3.
Report number
PSD--87

Conference

Title
European meeting on positron studies of defects.
Dates
23-27 Mar 1987.
Place
Wernigerode (German Democratic Republic).

INIS

Country of Publication
German Democratic Republic
Country of Input or Organization
German Democratic Republic
INIS RN
18083980
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
ALPHA PARTICLES; ANGULAR CORRELATION; ANNIHILATION; CRYSTAL DEFECTS; ENERGY RESOLUTION; EPITAXY; FILMS; GALLIUM ARSENIDES; GAMMA RADIATION; PHYSICAL RADIATION EFFECTS; POSITRONS; SI SEMICONDUCTOR DETECTORS; SILICON; SODIUM 22; TIN
Descriptors DEC
ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; ARSENIC COMPOUNDS; ARSENIDES; BETA DECAY RADIOISOTOPES; BETA-PLUS DECAY RADIOISOTOPES; CHARGED PARTICLES; CORRELATIONS; CRYSTAL STRUCTURE; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; GALLIUM COMPOUNDS; HELIUM IONS; INTERACTIONS; IONIZING RADIATIONS; IONS; ISOTOPES; LEPTONS; LIGHT NUCLEI; MATTER; MEASURING INSTRUMENTS; METALS; NUCLEI; ODD-ODD NUCLEI; PARTICLE INTERACTIONS; RADIATION DETECTORS; RADIATION EFFECTS; RADIATIONS; RADIOISOTOPES; RESOLUTION; SEMICONDUCTOR DETECTORS; SEMIMETALS; SODIUM ISOTOPES; YEARS LIVING RADIOISOTOPES

Optional Information

Notes
Published in summary form only.