Published August 20, 2012
| Version v1
Journal article
Universal mechanism for ion-induced nanostructure formation on III-V compound semiconductor surfaces
- 1. Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States)
Description
We have examined the formation of nanostructures on ion-irradiated compound semiconductor surfaces. We computed the ion doses needed to fully deplete group V elements from the surfaces. These group V depletion doses are in good agreement with the measured threshold ion doses for nucleation of group III-rich nanostructures on a wide variety of III-V compound semiconductor surfaces. Since the group V depletion doses decrease with increasing sputtering yield, these results suggest a universal nanostructure formation mechanism which depends upon the total sputtering yield of each III-V compound.
Additional details
Identifiers
- DOI
- 10.1063/1.4742863;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 101
- Journal Issue
- 8
- Journal Page Range
- p. 082101-082101.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44048117
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM COMPOUNDS; COMPUTERIZED SIMULATION; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; ION BEAMS; NANOSTRUCTURES; NUCLEATION; SEMICONDUCTOR MATERIALS; SPUTTERING; SURFACES
- Descriptors DEC
- BEAMS; MATERIALS; SIMULATION
Optional Information
- Notes
- (c) 2012 American Institute of Physics