Published August 20, 2012 | Version v1
Journal article

Universal mechanism for ion-induced nanostructure formation on III-V compound semiconductor surfaces

  • 1. Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States)

Description

We have examined the formation of nanostructures on ion-irradiated compound semiconductor surfaces. We computed the ion doses needed to fully deplete group V elements from the surfaces. These group V depletion doses are in good agreement with the measured threshold ion doses for nucleation of group III-rich nanostructures on a wide variety of III-V compound semiconductor surfaces. Since the group V depletion doses decrease with increasing sputtering yield, these results suggest a universal nanostructure formation mechanism which depends upon the total sputtering yield of each III-V compound.

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
101
Journal Issue
8
Journal Page Range
p. 082101-082101.4
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44048117
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ALUMINIUM COMPOUNDS; COMPUTERIZED SIMULATION; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; ION BEAMS; NANOSTRUCTURES; NUCLEATION; SEMICONDUCTOR MATERIALS; SPUTTERING; SURFACES
Descriptors DEC
BEAMS; MATERIALS; SIMULATION

Optional Information

Notes
(c) 2012 American Institute of Physics