Published 1982
| Version v1
Book
Spectrometric devices with semiconductor radiation detectors
Description
The CMEA standard applies for spectrometric equipment with semiconductor detectors for precision alpha, beta, gamma and X-ray spectrometry. The table is given of maximum values of relative (amplitude) resolution and for deviations of conversion characteristic, the maximum time of operating mode stabilization and the minimum time of the permanent operation of the equipment. (M.D.)
Additional details
Additional titles
- Subtitle (English)
- Specifications
- Original title (Czech)
- Spektrometricka zarizeni s polovodicovymi detektory ionizujiciho zareni
- Original subtitle (Czech)
- Zakladni parametry.
Publishing Information
- Publisher
- Vydavatelstvi UNM.
- Imprint Place
- Prague (Czechoslovakia)
- Imprint Pagination
- 8 p.
INIS
- Country of Publication
- Serbia and Montenegro
- Country of Input or Organization
- Serbia and Montenegro
- INIS RN
- 16024807
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Standard or Specification
- Descriptors DEI
- ALPHA DETECTION; BETA DETECTION; ENERGY RESOLUTION; ERRORS; GAMMA DETECTION; SEMICONDUCTOR DETECTORS; SPECTROMETERS; STANDARDIZATION; STANDARDIZED TERMINOLOGY; X-RAY DETECTION
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION
Optional Information
- Notes
- Czechoslovak State Standard based on COMECON Standard ST SEV 2670-80.
- Secondary number(s)
- CSN--35 6577.