Published February 1991
| Version v1
Journal article
X-ray specular reflectivity of the 4He liquid-vapor interface
- 1. Dept. of Physics and Div. of Applied Science, Harvard Univ., Cambridge, MA (USA)
Description
X-ray specular reflectivity measurements of a saturated film of helium absorbed onto an atomically flat silicon substrate have been made at several temperatures. The thickness of the film has been determined and some preliminary data on the structure of the 4He liquid-vapor interface are reported. (orig.)
Additional details
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 169
- Journal Issue
- pt.3
- Series
- Phys., B Condens. Matter.
- Journal Page Range
- 507-508
- ISSN
- 0921-4526
- CODEN
- PHYBE
Conference
- Title
- 19. international conference on low temperature physics (LT-19).
- Dates
- 16-22 Aug 1990.
- Place
- Brighton (UK).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 22079220
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ADSORPTION; HELIUM; HELIUM 4; INTERFACES; LIQUIDS; SILICON; SUBSTRATES; TEMPERATURE DEPENDENCE; THICKNESS; THIN FILMS; ULTRALOW TEMPERATURE; VAPORS; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELEMENTS; EVEN-EVEN NUCLEI; FILMS; FLUIDS; GASES; HELIUM ISOTOPES; IONIZING RADIATIONS; ISOTOPES; LIGHT NUCLEI; NONMETALS; NUCLEI; RADIATIONS; RARE GASES; SCATTERING; SEMIMETALS; STABLE ISOTOPES