In-plane current induced domain wall nucleation and its stochasticity in perpendicular magnetic anisotropy Hall cross structures
Creators
- 1. School of Physical and Mathematical Sciences, Nanyang Technological University, 21 Nanyang Link, Singapore 637371 (Singapore)
Description
Hall cross structures in magnetic nanowires are commonly used for electrical detection of magnetization reversal in which a domain wall (DW) is conventionally nucleated by a local Oersted field. In this letter, we demonstrate DW nucleation in Co/Ni perpendicular magnetic anisotropy nanowire at the magnetic Hall cross junction. The DWs are nucleated by applying an in-plane pulsed current through the nanowire without the need of a local Oersted field. The change in Hall resistance, detected using anomalous Hall effect, is governed by the magnetic volume switched at the Hall junction, which can be tuned by varying the magnitude of the applied current density and pulse width. The nucleated DWs are driven simultaneously under the spin transfer torque effect when the applied current density is above a threshold. The possibility of multiple DW generation and variation in magnetic volume switched makes nucleation process stochastic in nature. The in-plane current induced stochastic nature of DW generation may find applications in random number generation
Additional details
Identifiers
- DOI
- 10.1063/1.4935347;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 107
- Journal Issue
- 19
- Journal Page Range
- p. 192401-192401.5
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47056033
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ANISOTROPY; CURRENT DENSITY; HALL EFFECT; MAGNETIZATION; NANOWIRES; NUCLEATION; RANDOMNESS; STOCHASTIC PROCESSES; SWITCHES
- Descriptors DEC
- ELECTRICAL EQUIPMENT; EQUIPMENT; NANOSTRUCTURES
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC