Published September 2009 | Version v1
Journal article

Intermediate layer thickness dependence on switching field distribution in perpendicular recording media

  • 1. Data Storage Institute, A-STAR (Agency for Science Technology and Research), 5 Engineering Drive 1, Singapore-117 608 (Singapore)
  • 2. Department of Electrical and Computer Engineering, National University of Singapore, Singapore-117608 (Singapore)

Description

The effect of intermediate layer (IL) thickness on crystallographic texture and magnetic properties of CoCrPtSiO2 granular perpendicular recording media was investigated with switching field distribution (SFD) as the focus. Even though the c-axis orientation of the Co-based recording layer (RL) broadens with the reduction of IL thickness, the SFD becomes narrower. This result demonstrates that the intrinsic SFD is not directly dependent on c-axis orientation of the recording layer but instead dependent on the magnitude of exchange coupling. It is thus possible to have a medium with thin IL and narrow SFD. This is desirable for bit-patterned media (BPM), where highly exchange-coupled grains are required.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jmmm.2009.03.082

Additional details

Identifiers

DOI
10.1016/j.jmmm.2009.03.082;
PII
S0304-8853(09)00325-4;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
321
Journal Issue
17
Journal Page Range
p. 2682-2684
ISSN
0304-8853
CODEN
JMMMDC

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41009905
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CHROMIUM ALLOYS; COBALT ALLOYS; COUPLING; CRYSTALLOGRAPHY; DISTRIBUTION; LAYERS; MAGNETIC PROPERTIES; ORIENTATION; OXYGEN ADDITIONS; PLATINUM ALLOYS; SILICON ALLOYS; THICKNESS
Descriptors DEC
ALLOYS; DIMENSIONS; PHYSICAL PROPERTIES; PLATINUM METAL ALLOYS; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.