Published November 1, 2010 | Version v1
Journal article

Hybrid technology digital correlation spectrometers for astronomy and communications

  • 1. HYPRES, Inc. 175 Clearbrook Road, Elmsford, NY 10523 (United States)

Description

Superconductor and semiconductor technologies can be combined using hybrid-temperature hybrid-technology (HT)2 techniques to produce very-high-performance mixed-signal systems, including digital receivers and spectrometers. The thoughtful placement of the superconductor/semiconductor interface maximizes the output performance by balancing the bandwidth and digital speed of superconductor circuitry with the complexity and high aggregate data rate of semiconductor gate arrays and/or computers. Superconducting front ends can be used with auto- and cross-correlator circuits to monitor noisy spectra or to compare spectral details with known templates. Autocorrelators and cross-correlators are used as example systems. In addition, once interesting spectral features are identified, we show a band-pass digitizer can be used to zoom in on narrower swaths of bandwidth to obtain higher-resolution data. Such a coarse/fine digital RF spectrometer may find applications as diverse as radio astronomy and wireless communications.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physc.2010.05.157

Additional details

Identifiers

DOI
10.1016/j.physc.2010.05.157;
PII
S0921-4534(10)00413-2;

Publishing Information

Journal Title
Physica. C, Superconductivity
Journal Volume
470
Journal Issue
20
Journal Page Range
p. 1538-1545
ISSN
0921-4534
CODEN
PHYCE6

Conference

Title
22. international symposium on superconductivity
Acronym
ISS 2009
Dates
2-4 Nov 2009
Place
Tsukuba (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42000843
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPARATIVE EVALUATIONS; CORRELATIONS; INTERFACES; RESOLUTION; SEMICONDUCTOR MATERIALS; SPECTRA; SPECTROMETERS; SUPERCONDUCTORS; VELOCITY
Descriptors DEC
EVALUATION; MATERIALS; MEASURING INSTRUMENTS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.