Published September 2014 | Version v1
Journal article

NSVS4484038, A contact binary system at the short-period cutoff

  • 1. Key Laboratory of Optical Astronomy, National Astronomical Observatories, Chinese Academy of Sciences, Beijing 100012 (China)
  • 2. Department of Physics, China West Normal University, Nanchong 637002 (China)
  • 3. Purple Mountain Observatory, Chinese Academy of Sciences, Nanjing 210008 (China)

Description

We present a photometric study of the short-period eclipsing binary NSVS4484038. Time-series CCD photometry of the star in the B and V band was carried out. An orbital period of 0.218551 days was determined for the eclipsing binary and a revised linear ephemeris was given. The first photometric solution of the binary system was detected through light-curve synthesis using the Wilson-Devinney method. It reveals an overcontact configuration for the system with a filling-out factor of about 10%. The mass ratio was determined to be 2.74 with an inclination of 72.°1. The less massive secondary component is found to have a higher surface temperature than the primary by about 90 K, indicating that NSVS4484038 could be a contact system of W subtype. The star is then identified to be a new member of W UMa systems at the short-period cutoff. Comparisons with known contact binaries at the short-period cutoff, the properties, and the evolutionary status of the binary system are discussed.

Availability note (English)

Available from http://dx.doi.org/10.1088/0004-6256/148/3/40

Additional details

Identifiers

Publishing Information

Journal Title
Astronomical Journal (New York, N.Y. Online)
Journal Volume
148
Journal Issue
3
Journal Page Range
[5 p.]
ISSN
1538-3881

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46048592
Subject category
S79: ASTROPHYSICS, COSMOLOGY AND ASTRONOMY;
Descriptors DEI
BINARY STARS; CHARGE-COUPLED DEVICES; COMPARATIVE EVALUATIONS; CONFIGURATION; ECLIPSE; INCLINATION; MASS; MATHEMATICAL SOLUTIONS; PHOTOMETRY; STARS; SURFACES; SYNTHESIS; VISIBLE RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; EVALUATION; RADIATIONS; SEMICONDUCTOR DEVICES; STARS