Interactions of satellite-speed helium atoms with satellite-surfaces. 1. Spatial distributions of reflected helium atoms
Description
Interactions of satellite-speed helium atoms with practical satellite surfaces were investigated experimentally, and spatial distributions of satellite-speed helium beams scattered from four different engineering surfaces were measured. The 7000-m/s helium beams were produced using an arc-heated supersonic molecular beam source. The test surfaces included cleaned 6061-T6 aluminum plate, anodized aluminum foil, white paint, and quartz surfaces. Both in-plane (in the plane containing the incident beam and the surface normal) and out-of-plane spatial distributions of reflected helium atoms were measured for six different incidence angles (0, 15, 30, 45, 60, and 75 deg from the surface normal). It was found that a large fraction of the incident helium atoms were scattered back in the vicinity of the incoming beam, particularly in the case of glancing incidence angles. This unexpected scattering feature results perhaps from the gross roughness of these test surfaces. This prominent backscattering could yield drag coefficients which are higher than for surfaces with either forward-lobed or diffusive (cosine) scattering patterns
Availability note (English)
MF available from INIS under the Report Number.
Files
Additional details
Publishing Information
- Imprint Pagination
- 43 p.
- Report number
- N--75-27874
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 8304192
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ALUMINIUM; ATOM COLLISIONS; BACKSCATTERING; COLLISIONS; FOILS; HELIUM; PAINTS; PLATES; QUARTZ; SATELLITES; SPATIAL DISTRIBUTION; SURFACES
- Descriptors DEC
- CHALCOGENIDES; COATINGS; DISTRIBUTION; ELEMENTS; METALS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; RARE GASES; SCATTERING; SILICON COMPOUNDS; SILICON OXIDES
Optional Information
- Notes
- Available from NTIS. $3.75.
- Secondary number(s)
- NASA-CR--143111; UCLA-ENG--7546.