Published April 2005 | Version v1
Journal article

Ion-velocity dependence of high-density electronic excitation effects in oxide superconductors

  • 1. Department of Materials Science, Japan Atomic Energy Research Institute, Tokai Establishment (JAERI-Tokai), Tokai-mura, Ibaraki 319-1195 (Japan)
  • 2. Iwate University, Morioka, Iwate 020-0066 (Japan)
  • 3. Institute of Physical and Chemical Research (RIKEN), Wako, Saitama 351-0198 (Japan)
  • 4. Gesellschaft fuer Schwerionenforschung (GSI), Planckstrasse 1, D-64291 Darmstadt (Germany)
  • 5. Osaka Prefecture University, Gakuen-cho, Sakai-shi, Osaka 599-8570 (Japan)

Description

Thin films of EuBa2Cu3O y oxide superconductor have been irradiated with high energy heavy ions (80 MeV I, 125 MeV Br, 1.1 GeV Mo and 3.5 GeV Xe) having same electronic stopping power, S e, in order to investigate the ion-velocity dependence of the electronic excitation effects under the constant electronic energy deposition. Although S e is constant, a strong reduction in the irradiation effect on lattice parameter with increasing ion-velocity is observed in the low ion-velocity region around E ∼ 1 MeV/nucleon, while the ion-velocity dependence is hardly observed in the high ion-velocity region of E > 10 MeV/nucleon. If the observed velocity-dependence is assumed to be due to the change in the fraction of S e contributing to defect creation, the fraction in the low velocity region (E ∼ 0.6 MeV/nucleon) is estimated to be about two times larger than that in the high velocity region (E > 10 MeV/nucleon)

Additional details

Identifiers

DOI
10.1016/j.nimb.2004.12.031;
PII
S0168-583X(04)01296-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
230
Journal Issue
1-4
Journal Page Range
p. 136-141
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
21. international conference on atomic collisions in solids
Acronym
ICACS-21
Dates
4-9 Jul 2004
Place
Genova (Italy)

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.