X-ray photoelectron studies of near surface oxidation and plasmon excitation in spatially confined bi- and tri- layers periodic multilayer mirrors
Creators
- 1. Institute for Physics of Microstructures RAS, Afonino, Nizhny Novgorod 603087 (Russian Federation)
- 2. Research Institute of Physics, Southern Federal University, 194 Stachki Avenue, Rostov-on-Don 344090 (Russian Federation)
Description
Highlights: • X-ray photoelectron excited plasmon of Si and Be in bi- and tri- layers structure • Confinement of plasmon oscillation in spatially confined layers • Plasmon excitation of conduction electron in Be and valence electron in Si layers • Near surface oxidation of periodic multilayer structures The alternate bi- and tri- layers nanoscale periodic multilayers of Mo/Si, Mo/Be and Mo/Be/Si are useful for the high reflectivity mirrors, operating effectively around 13.5 nm of wavelength. In X-ray photoelectron spectroscopy (XPS), binding energy shift of BeO was observed in the Mo/Be structures. However, the chemical shifts of BeO and SiO2 was observed in the Mo/Be/Si multilayer structures. These evidences have indicated the near surface oxidation of multilayers. In the spatially confined layers, the plasmon was excited by the inelastic scattering of Mo4p photoelectrons, generated by the AlKα X-ray radiation of XPS. In the periodic multilayers, the plasmon was excited at higher energy as compared to the bulk counterpart, which was associated to quantum confinement of the condensed Si and Be nanolayers. In the bi- and tri- layers, the quantum confinement of plasmon in the Si nanolayer was fundamentally described by the density of valence electron and energy width of the band gap. However, in the bi- layer of Mo/Be, the plasmon shift of metallic Be layer was associated to confinement of the conduction electron density.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2020.138449Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2020.138449;
- PII
- S004060902030657X;
Publishing Information
- Journal Title
- Thin Solid Films (Print)
- Journal Volume
- 717
- Journal Page Range
- vp.
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54005196
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BERYLLIUM OXIDES; BINDING ENERGY; CHEMICAL SHIFT; CONFINEMENT; EXCITATION; INELASTIC SCATTERING; LAYERS; NANOFILMS; NANOSTRUCTURES; OSCILLATIONS; OXIDATION; PLASMONS; REFLECTIVITY; SILICA; SILICON OXIDES; VALENCE; WAVELENGTHS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BERYLLIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL REACTIONS; ELECTRON SPECTROSCOPY; ENERGY; ENERGY-LEVEL TRANSITIONS; FILMS; MATERIALS; MINERALS; NANOMATERIALS; OPTICAL PROPERTIES; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; QUASI PARTICLES; SCATTERING; SILICON COMPOUNDS; SPECTROSCOPY; SURFACE PROPERTIES; THIN FILMS
Optional Information
- Copyright
- Copyright (c) 2020 Elsevier B.V. All rights reserved.