Published 1992
| Version v1
Book
DC-SQUID with aluminium microbridges far from Tc
- 1. DRFMC/SPSMS/LCP, CENG, Grenoble (France)
- 2. CRTBT-CNRS, Grenoble (France)
- 3. L.M.M.-CNRS, Bagneux (France)
Description
We have realized reliable DC-SQUIDs in aluminium with two Dayem bridges in only one lithographic operation. These bridges appear to behave like classic Josephson junctions even at low temperature far from Tc. They are very durable and reproducible upon temperature cycling. They exhibit a considerable hysteresis and critical curents as low as 10 μA. An electronic setup has been developed in order to measure the critical current of these hysteretic SQUIDs with a typical noise of 8 10-6Φ0/Hz1/2. This non-destructive and damage free technique allows one to perform magnetization measurements on any material. (orig.)
Additional details
Publishing Information
- Publisher
- Springer.
- Imprint Place
- Berlin (Germany)
- ISBN
- 3-540-55396-7
- Imprint Title
- Superconducting devices and their applications. Proceedings
- Imprint Pagination
- 618 p.
- Journal Volume
- 64
- Series
- Springer proceedings in physics.
- Journal Page Range
- p. 286-291.
Conference
- Title
- Superconducting devices and their applications.
- Acronym
- 4. international conference on superconducting and quantum effect devices (SQUID-4)
- Dates
- 18-21 Jun 1991.
- Place
- Berlin (Germany).
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 24025611
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM; CRITICAL CURRENT; ELECTRON BEAMS; HYSTERESIS; JOSEPHSON JUNCTIONS; MAGNETIZATION; MEASURING METHODS; NOISE; SQUID DEVICES; STABILITY; TEMPERATURE DEPENDENCE; THERMAL CYCLING
- Descriptors DEC
- BEAMS; CURRENTS; ELECTRIC CURRENTS; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FLUXMETERS; LEPTON BEAMS; MAGNETIC MOMENTS; MAGNETIC PROPERTIES; MEASURING INSTRUMENTS; METALS; MICROWAVE EQUIPMENT; PARTICLE BEAMS; PHYSICAL PROPERTIES; SEMICONDUCTOR JUNCTIONS; SUPERCONDUCTING DEVICES