Analysis of structures based on a characteristic-strain model of creep
Description
A companion paper [Bolton J. In: A characteristic-strain model for creep, ECCC/I.Mech.E. conference on creep and fracture in high-temperature components, London, September 2005] describes a creep model based on a constant 'characteristic strain' at any temperature. The present paper discusses the application of such a model, first to simple structures and then to engineering components of general form under steady loading. A basis is proposed for identifying the stress within a structure, or within the critical part of a structure, which can be considered to govern both its overall and local deformations. The concept is similar to skeletal-point stress but is more readily applied to components of any shape. The implementation of the concept of 'structural stress' is discussed in the context of finite-element creep calculations. Consideration is given to the analysis of cracked structures, where very high strains at the crack tip must be accommodated
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ijpvp.2007.06.013Additional details
Identifiers
- DOI
- 10.1016/j.ijpvp.2007.06.013;
- PII
- S0308-0161(07)00071-3;
Publishing Information
- Journal Title
- International Journal of Pressure Vessels and Piping
- Journal Volume
- 85
- Journal Issue
- 1-2
- Journal Page Range
- p. 108-116
- ISSN
- 0308-0161
- CODEN
- PRVPAS
Conference
- Title
- ECCC international creep conference
- Dates
- 12-14 Sep 2005
- Place
- London (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39091881
- Subject category
- S42: ENGINEERING; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRACKS; CREEP; DEFORMATION; ENGINEERING; FINITE ELEMENT METHOD; FRACTURES; STRAINS; STRESSES
- Descriptors DEC
- CALCULATION METHODS; FAILURES; MATHEMATICAL SOLUTIONS; MECHANICAL PROPERTIES; NUMERICAL SOLUTION
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.