Published February 1, 2006
| Version v1
Journal article
Determination of the physical parameters distribution in spin transition compounds using experimental FORC diagram
- 1. Faculty of Physics, Department of Solid State and Theoretical Physics, Alexandru Ioan Cuza University, Blvd. Carol I, 11, 700506 Iasi (Romania) and Laboratoire de Magnetisme et d'Optique, CNRS-UMR 8634, Universite de Versailles, 45 Avenue des Etats-Unis 78035 (France)
- 2. Laboratoire de Magnetisme et d'Optique, CNRS-UMR 8634, Universite de Versailles, 45 Avenue des Etats-Unis 78035 (France)
- 3. Faculty of Physics, Department of Solid State and Theoretical Physics, Alexandru Ioan Cuza University, Blvd. Carol I, 11, 700506 Iasi (Romania)
Description
Spin transitions materials are characterized with an innovative experimental method, i.e. first-order reversal curve (FORC) diagram. The interpretation of the results is performed in the framework of two different Ising-like models: a mean-field approach and the exact solution done by the Monte Carlo entropic sampling (MCES) method
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2005.10.051;
- PII
- S0921-4526(05)01084-7;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 372
- Journal Issue
- 1-2
- Journal Page Range
- p. 215-218
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 5. international symposium on hysteresis and micromagnetic modeling
- Dates
- 30 May - 1 Jun 2005
- Place
- Budapest (Hungary)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37069974
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DIAGRAMS; DISTRIBUTION; EXACT SOLUTIONS; MAGNETIC MATERIALS; MEAN-FIELD THEORY; MONTE CARLO METHOD; SAMPLING; SPIN
- Descriptors DEC
- ANGULAR MOMENTUM; CALCULATION METHODS; INFORMATION; MATERIALS; MATHEMATICAL SOLUTIONS; PARTICLE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.