Published October 6, 2004 | Version v1
Journal article

In situ optical investigation of oligothiophene layers grown by organic molecular beam epitaxy

  • 1. Dipartimento di Fisica e Unita INFM, Universita di Roma 'Tor Vergata', Via della ricerca scientifica, I-00133, Rome (Italy)
  • 2. Dipartimento di Scienza dei Materiali e Unita INFM, Universita di Milano-Bicocca, Via Cozzi 53, I-20125 Milan (Italy)

Description

Reflectance anisotropy spectroscopy (RAS) has recently been used to monitor in situ and in real time the growth of thin organic layers in ultra high vacuum (UHV) (Goletti et al 2003 Appl. Phys. Lett. 83 4146). In this paper, after a short discussion of RAS, with particular attention to the application to organics, we present recent results on the deposition of ordered oligothiophene films by organic molecular beam epitaxy (OMBE), namely α-sexithiophene and quaterthiophene films onto potassium acid phthalate substrates

Availability note (English)

Available online at http://stacks.iop.org/0953-8984/16/S4393/cm4_39_014.pdf or at the Web site for the Journal of Physics. Condensed Matter (ISSN 1361-648X) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
16
Journal Issue
39
Journal Page Range
p. S4393-S4402
ISSN
0953-8984
CODEN
JCOMEL