X-ray photoelectron spectroscopy study on YbFe2As2 crystals prepared by different growth temperatures
- 1. Division of Physics, School of Advanced Sciences, Vellore Institute of Technology (VIT), Chennai Campus, Vandalur – Kelambakkam Road, Chennai, 600127 (India)
- 2. Division of Chemistry, School of Advanced Sciences, Vellore Institute of Technology (VIT), Chennai Campus, Vandalur – Kelambakkam Road, Chennai, 600127 (India)
- 3. Asia Pacific Center for Theoretical Physics, POSTECH Campus, Pohang, 37673 (Korea, Republic of)
- 4. Science and Engineering Research Board, Department of Science and Technology, Vasant Kunj, New Delhi, 110070 (India)
Description
Polycrystalline samples of YbFe2As2 were synthesized by double step solid-state reaction method. Two different samples were grown at the temperatures of 900 and 1200 °C. The synthesized YbFe2As2 polycrystalline samples were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDAX) and X-ray photoelectron spectroscopy (XPS). SEM images revealed that the YbFe2As2 compound was formed as polycrystalline with typical sizes of granules ranging from 5 to 10 μm. The Rietveld refinement of the XRD data of YbFe2As2 crystals was performed to understand the structural phase. The oxygen adsorption in to the surface of YbFe2As2 crystals was studied by means of XPS analysis. A possible explanation was given for the synthesis temperature dependent oxygen adsorption in to the YbFe2As2 based on the results of XPS, EDAX and resistance versus temperature measurements.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2020.412688Additional details
Identifiers
- DOI
- 10.1016/j.physb.2020.412688;
- PII
- S0921452620306724;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 604
- Journal Page Range
- vp.
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54007059
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ADSORPTION; OXYGEN; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY; X RADIATION; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; IONIZING RADIATIONS; MICROSCOPY; NONMETALS; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; SCATTERING; SORPTION; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2020 Elsevier B.V. All rights reserved.