Published 2018
| Version v1
Journal article
Characterization of HVCMOS sensors for the ATLAS pixel detector
- 1. IPE, Karlsruher Institut für Technologie (Germany)
Description
no abstract available
Availability note (English)
Available from: https://www.dpg-verhandlungen.de/Additional details
Additional titles
- Original title (German)
- Charakterisierung von HVCMOS Sensoren für den ATLAS Pixeldetektor
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Wuerzburg 2018 issue
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- DPG Spring meeting 2018 of the Section Matter and Cosmos (SMuK) with the Division of Physics Education and the working groups Equal Opportunities, Industry and Economics, Young DPG, Physics, Modern Information Technology and Artificial Intelligence
- Original Conference Title
- DPG-Fruehjahrstagung 2018 der Sektion Materie und Kosmos (SMuK) mit dem Fachverband Didaktik der Physik und den Arbeitskreisen Chancengleichheit, Industrie und Wirtschaft, Junge DPG, Physik, moderne Informationstechnologie und Kuenstliche Intelligenz
- Dates
- 19-23 Mar 2018
- Place
- Wuerzburg (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 51004498
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- ATLAS DETECTOR; CMOS CIRCUITS; CORRECTIONS; MOSFET; POSITION SENSITIVE DETECTORS; PULSE TECHNIQUES; PULSES; READOUT SYSTEMS; SEMICONDUCTOR DETECTORS; SENSORS; SPATIAL RESOLUTION; TIME RESOLUTION
- Descriptors DEC
- ELECTRONIC CIRCUITS; FIELD EFFECT TRANSISTORS; INTEGRATED CIRCUITS; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; MOS TRANSISTORS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DEVICES; TIMING PROPERTIES; TRANSISTORS
Optional Information
- Notes
- Session: T 5.3 Mo 16:30; Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 53(4)