Published November 3, 2008 | Version v1
Journal article

Anisotropy of the surface thermodynamic properties of silicon

  • 1. Interdisciplinaire de Nanoscience de Marseille, UPR CNRS 3118, Aix-Marseille Universite, Campus de Luminy, case 913, F-13288 Marseille Cedex 9 (France)

Description

Three main macroscopic quantities are necessary to describe the thermodynamic properties of a crystalline surface: its surface free energy, its surface stress and its surface stiffness. Obviously, for a crystal, these quantities depend upon the crystallographic direction. We report experimental measurements of the crystalline anisotropy of all these quantities for silicon crystal. Surface free energy and surface stiffness anisotropies are deduced from a careful study of the silicon equilibrium shape, whereas the surface-stress anisotropy is deduced from artificial destabilization of crystalline Si surfaces by means of electromigration

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2008.08.143

Additional details

Identifiers

DOI
10.1016/j.tsf.2008.08.143;
PII
S0040-6090(08)00953-X;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
517
Journal Issue
1
Journal Page Range
p. 65-68
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
5. International conference on silicon epitaxy and heterostructures
Acronym
ICSI-5
Dates
20-24 May 2007
Place
Marseille (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40058973
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANISOTROPY; CRYSTALLOGRAPHY; CRYSTALS; ELASTICITY; ELECTROPHORESIS; EQUILIBRIUM; FLEXIBILITY; SILICON; STRESSES; SURFACE ENERGY; SURFACES
Descriptors DEC
ELEMENTS; ENERGY; FREE ENERGY; MECHANICAL PROPERTIES; PHYSICAL PROPERTIES; SEMIMETALS; SURFACE PROPERTIES; TENSILE PROPERTIES; THERMODYNAMIC PROPERTIES

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.