Published June 15, 1973 | Version v1
Journal article

Target backings for charged particle induced X-ray fluorescence analysis

  • 1. Guelph Univ., Ontario (Canada). Dept. of Physics

Description

no abstract available

Additional details

Identifiers

Publishing Information

Journal Title
Nuclear Instruments and Methods
Journal Volume
109
Journal Issue
3
Series
Nucl. Instrum. Methods.
Journal Page Range
429-437
ISSN
0029-554X

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
5121596
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
FOILS; GRAPHITE; IMPURITIES; MEV RANGE 01-10; PROTON BEAMS; TARGETS; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTRA
Descriptors DEC
BEAMS; CARBON; ELEMENTS; ENERGY RANGE; MEV RANGE; NONMETALS; NUCLEON BEAMS; PARTICLE BEAMS; SPECTRA

Optional Information

Notes
Updated automatically by Metadata and Full-Text Enrichment Agent