Published October 2010 | Version v1
Journal article

Preparation and characterization of indium doped CdS0.2Se0.8 thin films by spray pyrolysis

  • 1. Thin Film Physics Laboratory, Department of Physics, Electronics and Photonics, Rajarshi Shahu Mahavidyalaya, Latur 413512, Maharashtra (India)

Description

The CdS0.2Se0.8 and indium doped CdS0.2Se0.8 thin films have been deposited onto the amorphous glass and fluorine doped tin oxide coated glass substrates by spray pyrolysis. The doping concentration of indium has been optimized by photoelectrochemical characterization technique. The structural, surface morphological, optical and electrical properties of CdS0.2Se0.8 and indium doped CdS0.2Se0.8 thin films have been studied. X-ray diffraction studies reveal that the films are polycrystalline in nature with hexagonal crystal structure. Scanning electron microscopy studies reveal that the grains are uniform with uneven spherically shaped, distributed over the entire substrate surface. The complete surface morphology has been changed after doping. In optical studies, the transition of the deposited films is found to be direct allowed with optical energy gaps decreasing from 1.91 to 1.67 eV with indium doping. Semiconducting behavior has been observed from resistivity measurements. The thermoelectric power measurements reveal that the films exhibit n-type conductivity.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.materresbull.2010.06.034

Additional details

Identifiers

DOI
10.1016/j.materresbull.2010.06.034;
PII
S0025-5408(10)00237-0;

Publishing Information

Journal Title
Materials Research Bulletin
Journal Volume
45
Journal Issue
10
Journal Page Range
p. 1455-1459
ISSN
0025-5408
CODEN
MRBUAC

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.