Deep-level transient spectroscopy system using a spectrum analyzer

In order to measure the thermal emission rate of a trap in semiconductor material without scanning the temperature, a new method, which utilizes a spectrum analyzer, has been developed. The theory on which our measuements depend is based on the relation between the time constant of a pure exponential wave and the relative amplitudes of its Fourier Components. The time constant is given by tau/sub s/=(tau/2π)[(10/sup c/-1)/(m2-10/sup c/n2)]/sup 1/2/, where c=(X-italic/sub n/-x/sub m//10, tau is the period of the exponential wave, and x/sub n/ and x/sub m/ are the amplitudes of the nth and mth harmonics in dB, respectively