Published June 2008 | Version v1
Journal article

Growth mechanisms of interstitial loops in α-doped UO2 samples

  • 1. Delft University of Technology, Reactor Institute Delft, Mekelweg 15, 2629JB Delft (Netherlands)
  • 2. European Commission, Joint Research Centre, Institute for Transuranium Elements, P.O. Box 2340, 76125 Karlsruhe (Germany)
  • 3. Laboratoire d'Energetique et de Mecanique Theorique et Appliquee, CNRS-UMR 7563, ENSEM-INPL, 2 avenue de la Foret de Haye, 54506 Vandoeuvre les Nancy (France)
  • 4. Argonne National Laboratory, Nuclear Engineering-208, Argonne, IL 60439 (United States)

Description

New experimental size distributions are presented for interstitial-type dislocation loops in (U, Pu)O2 samples after 4 and 7 years of self-irradiation along with a new model. For this model, the work of Hayns has been extended to doped materials and to take into account additional phenomena, namely re-solution and coalescence as applied to gas bubble precipitation. The calculations are compared to the experimental size distributions obtained by means of Transmission Electron Microscopy for two different storage times. The role of re-solution and coalescence is discussed based on this model. This constitutes a basis for modelling the high burn-up structure (HBS) formation which is a consequence of the accumulation of radiation damage in nuclear fuels

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2008.03.154

Additional details

Identifiers

DOI
10.1016/j.nimb.2008.03.154;
PII
S0168-583X(08)00436-9;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
266
Journal Issue
12-13
Journal Page Range
p. 3008-3012
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
14. international conference on radiation effects in insulators
Acronym
REI-14
Dates
28 Aug - 1 Sep 2007
Place
Caen (France)

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.