Published April 30, 2010 | Version v1
Journal article

Relationship between Ba atom emission and electrode temperature in a low-pressure fluorescent lamp

  • 1. Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, 6-1 Kasugakouen, Kasuga, Fukuoka 816-8580 (Japan)
  • 2. Lighting Company, Panasonic Corporation, 1-1 Saiwaicho, Takatsuki, Osaka 569-1193 (Japan)

Description

A relationship between emission characteristics of Ba atom as an emitter material and temperature distributions of an electrode in a fluorescent lamp is described, which is measured by using laser-induced fluorescence and black-body radiation method, respectively. In a virgin lamp, a hot spot observed at the electrode edge connected to the power supply is the main source of Ba atom emission. In a long-term-used lamp, it is shown that Ba atom emission, thermionic electron emission in cathode half-cycle and electron collection in anode half-cycle are most active on the hot spot appearing on the center of the electrode.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2009.11.041

Additional details

Identifiers

DOI
10.1016/j.tsf.2009.11.041;
PII
S0040-6090(09)01935-X;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
518
Journal Issue
13
Journal Page Range
p. 3449-3452
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
22. symposium on plasma science for materials
Acronym
SPSM-22
Dates
15-16 Jun 2009
Place
Tokyo (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42054840
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANODES; BARIUM; BLACKBODY RADIATION; CATHODES; ELECTRON EMISSION; FLUORESCENCE; FLUORESCENT LAMPS; HOT SPOTS; TEMPERATURE DISTRIBUTION
Descriptors DEC
ALKALINE EARTH METALS; ELECTRODES; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; LIGHT BULBS; LUMINESCENCE; METALS; PHOTON EMISSION; RADIATIONS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.