Published 1994 | Version v1
Miscellaneous Metadata-only

Compton suppression spectrometer with parallel sampling model of anti-coincidence counting system

Creators

  • 1. China Univ. of Science and Technology, Hefei, AH (China)
  • 2. Academia Sinica, Beijing, BJ (China). Inst. of High Energy Physics
  • 3. NSRL, Hefei (China)

Description

Compton suppression spectrometer for the measurement of low background γ ray has adapted the anti-coincidence counting system of parallel sampling model and an effective material shielding, also automatic data collecting and processing. In the well-type anti-coincidence model, the detecting sensitivity was 2.02 pCi for 137Cs standard thin-film source which was placed above 3.5 cm from NaI (Tl) main detector. Integral background was 115 cpm in the energy range 50∼2000 keV. Compared to the model without anti-coincidence, it was reduced 61.5%

Part of:
Proceedings of 7. national conference on nuclear electronics and nuclear detection technology: Pt.1

Additional details

Publishing Information

Imprint Title
Proceedings of 7. national conference on nuclear electronics and nuclear detection technology: Pt.1
Imprint Pagination
359 p.
Journal Page Range
p. 191-195.

Conference

Title
7. national conference on nuclear electronics and nuclear detection technology.
Dates
6-12 Oct 1994.
Place
Lushan (China).

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
28019296
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ANTICOINCIDENCE; BACKGROUND NOISE; COMPTON EFFECT; DATA ACQUISITION; DATA ANALYSIS; ELECTRONIC CIRCUITS; GAMMA SPECTROMETERS; PERFORMANCE; SENSITIVITY; SHIELDING; STABILITY
Descriptors DEC
BASIC INTERACTIONS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; INTERACTIONS; MEASURING INSTRUMENTS; NOISE; SCATTERING; SPECTROMETERS

Optional Information