Published October 2016
| Version v1
Journal article
Development of fast shutter for diagnosis system in Z-pinch experiment
- 1. State Key Laboratory of Environment Simulation and Effect for Intense Pulsed Radiation, Northwest Institute of Nuclear Technology, Xi'an (China)
Description
The debris or splashing mass will be produced by Z-pinch loads after the stagnation phase in Z-pinch experiments. The debris can arrive at the diagnosis devices and cause pollution to the optic units. In this paper, a kind of fast shutter based on the principle of electromagnetic induction was developed. The velocity, the discharge current and the shut-down time of fast shutter were analyzed based on the energy conservation principle and circuit model. The experimental results show that the velocity of fast shutter is nearly 19 m/s and the jitter of shut-down time is 85 μs. These experimental data show a good agreement with the calculation results. (authors)
Additional details
Identifiers
Publishing Information
- Journal Title
- Atomic Energy Science and Technology
- Journal Volume
- 50
- Journal Issue
- 10
- Journal Page Range
- p. 1897-1901
- ISSN
- 1000-6931
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 50026245
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ELECTROMAGNETIC RADIATION; ENERGY CONSERVATION; INDUCTION; LINEAR Z PINCH DEVICES; OPTICS; THERMONUCLEAR REACTIONS; VELOCITY
- Descriptors DEC
- LINEAR PINCH DEVICES; NUCLEAR REACTIONS; NUCLEOSYNTHESIS; OPEN PLASMA DEVICES; PINCH DEVICES; RADIATIONS; SYNTHESIS; THERMONUCLEAR DEVICES
Optional Information
- Notes
- 8 figs., 11 refs.; http://dx.doi.org/10.7538/yzk.2016.50.10.1897