Published 2020
| Version v1
Book
Investigation of radiation defects created by heavy ions in silicon nuclear radiation detectors
Creators
- 1. FTI im. A.F. Ioffe, Sankt-Peterburg (Russian Federation)
Description
no abstract available
Additional details
Additional titles
- Original title (Russian)
- Исследование радиационных дефектов, создаваемых тяжелыми ионами, в кремниевых детекторах ядерных излучений
Publishing Information
- Publisher
- POLITEKh-PRESS
- Imprint Place
- Sankt-Peterburg (Russian Federation)
- ISBN
- 978-5-7422-7050-8
- Imprint Title
- International conference #Left-Pointing Double Angle Quotation Mark#PhysicA.SPb#Right-Pointing Double Angle Quotation Mark#. Thesis of reports
- Imprint Pagination
- 550 p.
- Journal Page Range
- p. 365-367
Conference
- Title
- International conference on PhysicA.SPb
- Original Conference Title
- Mezhdunarodnaya konferentsiya «FizikA.SPb»
- Dates
- 19-23 Oct 2020
- Place
- Sankt-Peterburg (Russian Federation)
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 54099000
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- ACCELERATORS; ANNEALING; BRAGG REFLECTION; CONCENTRATION RATIO; CRYSTAL DEFECTS; DISTRIBUTION FUNCTIONS; HEAVY IONS; ION BEAMS; PHOTOLUMINESCENCE; RADIATION EFFECTS; SI SEMICONDUCTOR DETECTORS; VACANCIES
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIMENSIONLESS NUMBERS; EMISSION; FUNCTIONS; HEAT TREATMENTS; IONS; LUMINESCENCE; MEASURING INSTRUMENTS; PHOTON EMISSION; POINT DEFECTS; RADIATION DETECTORS; REFLECTION; SEMICONDUCTOR DETECTORS
Optional Information
- Notes
- 4 refs. Imprint:Mezhdunarodnaya konferentsiya #Left-Pointing Double Angle Quotation Mark#FizikA.SPb#Right-Pointing Double Angle Quotation Mark#. Tezisy dokladov