Differential characteristics of secondary - emission phenomena and structure of material

It was studied the correlation between differential characteristics of secondary-emission phenomena (secondary-ion mass-spectra (SIMS), Auger-electron energy spectra by electrons (AES) and ions (AIS) excitation, X-ray photo-electron spectra (ESCA)) and structure of the irradiated materials. The variation of the material structure are explained by the following changes: 1) preparation method 2) crystal structure 3) presence of plastic deformation The measuring was done with the help of ion microanalyser IMS-4f (CAMECA), Auger spectrometer PHI-600, X-ray photo-electrons spectrometer PHI-5400. It was researched carbon ribbons, that were produced by means of 'hot' pressing from coal powder; polycrystal of Al (having been pressed up and initial); monocrystal of Si(110), amorphized by ion bombardment. Target structure variation resulted in the visual modification of spectra while ion irradiation. In SIMS spectra yield of cluster ions changed, the yield being decreased while original sample structure disturbance (1-1,2 order). In Auger spectra the structure became more sharp (satellite relation amplitude grew and atom Auger peak sharply increased). During the electron excitation there were no visible variation of Auger spectra form. Variations in ESCA and IRA spectra are not found also. The effects being observed are explained if we suppose that in material structure changing their electron structure remains constant, but forming the condition of atom collision cascade are changed in the subsurface layer of the solid