Directional Auger electron spectroscopy and single-scattering cluster calculations study of the Ni(111)-Pb system
Creators
- 1. Institut fuer Physikalische und Theoretische Chemie, Universitaet Bonn, Wegelerstr. 12, D-53115 Bonn (Germany)
- 2. Institute of Experimental Physics, University of Wroclaw, pl. Maxa Borna 9, PL 50-204 Wroclaw (Poland)
Description
The crystalline structure of ultrathin Pb layers deposited on the Ni(111) surface in ultrahigh vacuum was investigated with the use of directional Auger peak electron spectroscopy (DAES). Experimental DAES data recorded for the primary electron beam energies in the range 1.2-2.2 keV were compared with theoretical profiles obtained with the use of single-scattering cluster calculations for clean and covered Ni(111). Similar intensity maxima reflecting the crystalline structure of the Ni(111) sample were observed on experimental and theoretical profiles. Results obtained after deposition of 4 ML of Pb on Ni(111) at the substrate temperature T=150 K exhibit intensity maxima corresponding to two mutually rotated Pb(111) domains. The populations of two possible Pb domains were determined by an R-factor analysis. The growth of one domain was found to be preferred, which can be rationalized by the miscut of the Ni(111) sample and the resulting step orientation
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 72
- Journal Issue
- 12
- Journal Page Range
- p. 125426-125426.5
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37031812
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- AUGER ELECTRON SPECTROSCOPY; CRYSTAL STRUCTURE; DEPOSITION; ELECTRON BEAMS; KEV RANGE; LAYERS; LEAD; NICKEL; R FACTORS; SCATTERING; SUBSTRATES; SURFACES; THIN FILMS
- Descriptors DEC
- BEAMS; ELECTRON SPECTROSCOPY; ELEMENTS; ENERGY RANGE; FILMS; LEPTON BEAMS; METALS; PARTICLE BEAMS; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2005 The American Physical Society