Investigations into the trace element variations in wheat grains by hand held X-ray Fluorescence

Wheat of different genotypes was analyzed for their micro and macro nutrient contents using HHXRF. It was found that K and Ca was present in significant quantities and besides other trace elements Fe and Zn were present showing a positive trend for crop improvement programme since wheat is Indian staple food, the objective was to find the Fe and Zn content in each of these genotypes to have high yielding nutritionally superior genotypes (1) Five different genotypes of wheat whole wheat, machine powdered and finely powdered by pestle and mortar were analyzed for the trace elemental contents for comparison using HHXRF. Al, Si, K, Ca, Fe and Zn are seen to be present significantly which are useful elements. There are no toxic elements which may harm the human consumption. The role of each of these elements needs to be investigated and the study is underway for further conclusions. Al,S and P which cannot be detected by many conventional instruments in XRF due to the detector window absorbing low energy X-rays could be detected by HHXRF. HHXRF has SDD (Silicon drift detector) which has a graphene window and the Al, P, S X-rays do not get absorbed unlike in the Si (Li) (Lithium drifted Silicon X-ray detector which has Be window and absorbs low energy X-rays below Z<19. HHXRF can be a useful tool for detecting Al in samples