Investigation on optical absorption properties of ion irradiated single walled carbon nanotubes
- 1. Department of Physics, Panjab University, Chandigarh (India)
- 2. Materials Research Laboratory, School of Physics and Materials Science, Thapar University, Patiala (India)
- 3. Materials Science Group, Inter University Accelerator Centre, ArunaAsaf Ali Marg, NewDelhi (India)
- 4. Electron Microscopy and Nanoscience laboratory, Punjab Agriculture University, Ludhiana (India)
Description
In the present study change in the optical absorption properties of single walled carbon nanotubes (SWCNTs) under nickel ion (60 MeV) irradiation at various fluences has been investigated. Langmuir Blodgett technique is used to deposit SWCNT thin film of uniform thickness. AFM analysis shows a network of interconnected bundles of nanotubes. UV-Vis-NIR absorption spectra indicate that the sample mainly contain SWCNTs of semiconducting nature. It has been found in absorption spectra that there is decrease in the intensity of the characteristic SWCNT peaks with increase in fluence. At fluence value 1×1014 ions/cm2 there is almost complete suppression of the characteristic SWCNTs peaks.The decrease in the optical absorption with increase in fluence is due to the increase in the disorder in the system which leads to the decrease in optically active states
Additional details
Identifiers
- DOI
- 10.1063/1.4929253;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1675
- Journal Issue
- 1
- Journal Page Range
- p. 030037-030037.4
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 4. national conference on advanced materials and radiation physics
- Acronym
- AMRP-2015
- Dates
- 13-14 Mar 2015
- Place
- Longowal (India)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47058913
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; ION BEAMS; IRRADIATION; MEV RANGE; NEAR INFRARED RADIATION; NICKEL IONS; PHYSICAL RADIATION EFFECTS; THIN FILMS; ULTRAVIOLET SPECTRA; VISIBLE SPECTRA
- Descriptors DEC
- BEAMS; CARBON; CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; FILMS; INFRARED RADIATION; IONS; MICROSCOPY; NANOSTRUCTURES; NANOTUBES; NONMETALS; RADIATION EFFECTS; RADIATIONS; SPECTRA; SPECTROSCOPY
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC