Published November 15, 2008 | Version v1
Journal article

Time dependence of the electronic structure of an electron-beam-irradiated C60 film

  • 1. Department of Nuclear Engineering and Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro, Tokyo 152-8550 (Japan)
  • 2. UVSOR Facility, Institute for Molecular Science, and School of Physical Sciences, The Graduate University for Advanced Studies (SOKENDAI), Myoudaiji, Okazaki, Aichi 444-8585 (Japan)

Description

Time dependence of the electronic structure of an electron-beam (EB) irradiated C60 film (20-30 nm thick) has been examined using in situ high-resolution ultraviolet photoelectron spectroscopy. It is found that the electronic states of the C60 film have been changed continuously from an insulator (pristine C60 films) to a semiconductor and finally to a metal as EB-irradiation time increased. This can be explained by the increase in polymerization degree of a C60 polymer with a given cross-linked structure derived from the general Stone-Wales rearrangement from [Beu et al.,Phys. Rev. B 72, 155416 (2005)]. In addition, this finding suggests that the electronic properties of the C60 film can be controlled only in the EB-irradiated region by varying the irradiation time, which is interesting when applied to electronic devices

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
104
Journal Issue
10
Journal Page Range
p. 103706-103706.3
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
(c) 2008 American Institute of Physics