Time dependence of the electronic structure of an electron-beam-irradiated C60 film
Creators
- 1. Department of Nuclear Engineering and Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro, Tokyo 152-8550 (Japan)
- 2. UVSOR Facility, Institute for Molecular Science, and School of Physical Sciences, The Graduate University for Advanced Studies (SOKENDAI), Myoudaiji, Okazaki, Aichi 444-8585 (Japan)
Description
Time dependence of the electronic structure of an electron-beam (EB) irradiated C60 film (20-30 nm thick) has been examined using in situ high-resolution ultraviolet photoelectron spectroscopy. It is found that the electronic states of the C60 film have been changed continuously from an insulator (pristine C60 films) to a semiconductor and finally to a metal as EB-irradiation time increased. This can be explained by the increase in polymerization degree of a C60 polymer with a given cross-linked structure derived from the general Stone-Wales rearrangement from [Beu et al.,Phys. Rev. B 72, 155416 (2005)]. In addition, this finding suggests that the electronic properties of the C60 film can be controlled only in the EB-irradiated region by varying the irradiation time, which is interesting when applied to electronic devices
Additional details
Identifiers
- DOI
- 10.1063/1.3028263;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 104
- Journal Issue
- 10
- Journal Page Range
- p. 103706-103706.3
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40059535
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ELECTRON BEAMS; ELECTRONIC EQUIPMENT; ELECTRONIC STRUCTURE; FULLERENES; IRRADIATION; METALS; PHOTOELECTRON SPECTROSCOPY; POLYMERIZATION; POLYMERS; SEMICONDUCTOR MATERIALS; THIN FILMS; TIME DEPENDENCE; ULTRAVIOLET RADIATION
- Descriptors DEC
- BEAMS; CARBON; CHEMICAL REACTIONS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; EQUIPMENT; FILMS; LEPTON BEAMS; MATERIALS; NONMETALS; PARTICLE BEAMS; RADIATIONS; SPECTROSCOPY
Optional Information
- Notes
- (c) 2008 American Institute of Physics