Which orbital and charge ordering in transition metal oxides can resonant X-ray diffraction detect?
Creators
- 1. Equipe de Physique des Surfaces et Interfaces, Institut de Physique de Rennes UMR UR1-CNRS 6251, Universite de Rennes 1, F-35042 Rennes Cedex (France)
Description
The present article is a brief critical review about the possibility of detecting charge and/or orbital order in transition-metal oxides by means of resonant x-ray diffraction. Many recent models of transition-metal oxides are based on charge and/or orbitally ordered ground-states and it has been claimed in the past that resonant x-ray diffraction is able to confirm or reject them. However, in spite of the many merits of this technique, such claims are ambiguous, because the interpretative frameworks used to analyze such results in transition-metal oxides, where structural distortions are always associated to the claimed charged/orbitally ordered transition, strongly influence (not to say suggest) the answer. In order to clarify this point, I discuss the two different definitions of orbital and charge orderings which are often used in the literature without a clear distinction. My conclusion is that the answer to the question of the title depends on which definition is adopted.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/190/1/012008Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 190
- Journal Issue
- 1
- Journal Page Range
- [12 p.]
- ISSN
- 1742-6596
Conference
- Title
- 14. international conference on X-ray absorption fine structure
- Acronym
- XAFS14
- Dates
- 26-31 Jul 2009
- Place
- Camerino (Italy)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42029997
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- GROUND STATES; OXIDES; RESONANCE SCATTERING; REVIEWS; TRANSITION ELEMENT COMPOUNDS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DOCUMENT TYPES; ENERGY LEVELS; INELASTIC SCATTERING; OXYGEN COMPOUNDS; SCATTERING