Published September 2011
| Version v1
Journal article
Investigation of the formation of quasicrystalline Al70-Pd20-Re10 phase in situ during annealing
Creators
- 1. Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)
- 2. Russian Research Center Kurchatov Institute (Russian Federation)
Description
The change in the phase composition of thin-film layered AlPdRe nanostructures during annealing, which led to the formation of a quasicrystalline layer, has been studied in situ. It is shown that the Al3Pd phase is formed at a temperature above 260°C, which transforms into the AlPd phase at 580°C, and the icosahedral quasicrystalline Al-Pd-Re phase is formed at 680°C.
Additional details
Identifiers
Publishing Information
- Journal Title
- Crystallography Reports
- Journal Volume
- 56
- Journal Issue
- 5
- Journal Page Range
- p. 871-874
- ISSN
- 1063-7745
- CODEN
- CYSTE3
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44014223
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM ALLOYS; ANNEALING; LAYERS; NANOSTRUCTURES; PALLADIUM ALLOYS; RHENIUM ALLOYS; TEMPERATURE RANGE 0400-1000 K; THIN FILMS
- Descriptors DEC
- ALLOYS; FILMS; HEAT TREATMENTS; PLATINUM METAL ALLOYS; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2011 Pleiades Publishing, Ltd.