Published September 1999
| Version v1
Journal article
Gamma spectrometers based on compressed xenon
- 1. Moskovskij Gosudarstvennyj Inzhenerno-Fizicheskij Inst., Moscow (Russian Federation)
Description
The basis results of studies on the compressed Xe properties are presented and the designs and basic physicotechnical and operational characteristics of γ spectrometers created on the basis thereof are described. The energy resolution of 14.4 keV (10 keV with exclusion of electronics noises) on the γ line with the energy of 662 keV are obtained for the γ spectrometer on the basis of a cylindrical ionization chamber with a screening grid. Examples of using the xenon γ spectrometers are presented
Abstract (Russian)
Представлены основные результаты исследований свойст сжатого Хе, описаны конструкции и основные физико-технические и эксплутационные характеристики созданных на его основе γ-спектрометров. Для γ-спектрометра на основе цилиндрической ионизационной камеры с экранирующей сеткой получено энергетическое разрешение 14,4 кэВ (10 кэВ с исключением шумов электроники) на γ-линии с энергией 662 кэВ. Приведены примеры использования ксеночных γ-спектрометровAdditional details
Additional titles
- Original title (Russian)
- Гамма-спектрометры на сжатом ксеноне
Publishing Information
- Journal Title
- Pribory i Tekhnika Ehksperimenta
- Journal Issue
- no.5
- Journal Page Range
- p. 114-122
- ISSN
- 0032-8162
- CODEN
- PRTEAJ
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 31015790
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DIAGRAMS; ELECTRIC POTENTIAL; ELECTRON DRIFT; ENERGY RESOLUTION; GAMMA SPECTRA; GAMMA SPECTROMETERS; IONIZATION CHAMBERS; KEV RANGE 10-100; MEDIUM PRESSURE; PERFORMANCE TESTING; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; XENON
- Descriptors DEC
- ELEMENTS; ENERGY RANGE; FLUIDS; GASES; INFORMATION; KEV RANGE; MEASURING INSTRUMENTS; NONMETALS; RADIATION DETECTORS; RARE GASES; RESOLUTION; SPECTRA; SPECTROMETERS; TEMPERATURE RANGE; TESTING
Optional Information
- Notes
- 22 refs., 14 figs.