Published 1987
| Version v1
Book
Chemical vapor deposited boron carbide
Creators
- 1. Dept. of Geology, Univ. of New Mexico, Albuquerque, NM (USA)
Description
Detailed analytical electron microscope (AEM) studies of yellow whiskers produced by chemical vapor deposition (CVD) show that two basic types of whiskers are produced at low temperatures (between 12000C and 14000C) and low boron to carbon gas ratios. Both whisker types show planar microstructures such as twin planes and stacking faults oriented parallel to, or at a rhombohedral angle to, the growth direction. For both whisker types, the presence of droplet-like terminations containing both Si and Ni indicate that the growth process during CVD is via a vapor-liquid-solid (VLS) mechanisms
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (USA)
- ISBN
- 0-931837-64-2
- Imprint Title
- Novel refractory semiconductors
- Journal Page Range
- vp.
Conference
- Title
- Materials Research Society symposium on novel refractory semiconductors.
- Dates
- 21-23 Apr 1987.
- Place
- Anaheim, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 20032874
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BORON CARBIDES; CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; FABRICATION; GRAIN ORIENTATION; MICROSTRUCTURE; NICKEL; SILICON; STACKING FAULTS; STRUCTURAL CHEMICAL ANALYSIS; TWINNING; VERY HIGH TEMPERATURE; WHISKERS
- Descriptors DEC
- BORON COMPOUNDS; CARBIDES; CARBON COMPOUNDS; CHEMICAL COATING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DEPOSITION; ELEMENTS; METALS; MONOCRYSTALS; ORIENTATION; SEMIMETALS; SURFACE COATING; TRANSITION ELEMENTS