Published February 15, 2019 | Version v1
Journal article

Mechanisms of friction reduction of nanoscale sliding contacts achieved through ultrasonic excitation

  • 1. Department of Mechanical and Manufacturing Engineering, University of Calgary, 2500 University Dr. NW., Calgary, Alberta T2N 1N4 (Canada)

Description

Friction reduction is an important issue for proper functioning of nano-/micro-electromechanical systems (N-/MEMS) due to their large surface to volume ratios and the inability of traditional liquid lubricants to effectively lubricate sliding contacts. One efficient technique to achieve substantially lowered friction at the nanoscale, as well as superlubricity in some instances, was investigated with the coupling of ultrasonic actuation of the sliding contact in an atomic force microscope (AFM). Despite the successful application of ultrasonic AFM methods in achieving mechanical property measurements and nanoscale subsurface imaging of soft and hard materials, the mechanism of friction reduction in the microscopic contact and the influence of the ultrasonic parameters on friction reduction are still elusive. In this study, the effects of excitation amplitude, applied normal force, tip radius, and humidity on friction have been investigated in detail. Ultrasonic force microscopy (UFM) results are compared against those collected with conventional contact-AFM (C-AFM) and indicate that a reduction in the adhesive interaction between the tip and sample, as well as a reduction in the shear strength can explain the mechanisms of the friction reduction in UFM method. This study opens up a new door for the control of friction and wear, which is critical for the increased lifetime of AFM probes, N-/MEMS devices and would potentially bridge the gap between nanotribology and other fields, such as nanomachining, nanolithography and biomaterials imaging. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6528/aaf3cd

Additional details

Identifiers

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
30
Journal Issue
7
Journal Page Range
[10 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
51044008
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ADHESIVES; ATOMIC FORCE MICROSCOPY; EXCITATION; FRICTION; HUMIDITY; MEMS; MICROSCOPES; NANOSTRUCTURES; SHEAR PROPERTIES; SURFACES; ULTRASONIC WAVES; WEAR
Descriptors DEC
ENERGY-LEVEL TRANSITIONS; MECHANICAL PROPERTIES; MICROSCOPY; MOISTURE; SOUND WAVES