Published 1985 | Version v1
Book

''Elemental analysis - New technique for any element to the few-atom level''

  • 1. Atom Sciences, Inc., 114 Ridgeway Center, Oak Ridge, TN (USA)

Description

Single-atom counting by Resonance Ionization Spectroscopy (RIS) is a relatively new technology for ultra-trace element analysis. It is being developed by Atom Sciences for a variety of applications. RIS comprises the stepwise excitation, ionization, and counting of atoms of a pre-selected element, generally in a large background of other elements. Because narrowband lasers are used, sufficient optical power enables essentially all of the atoms of the selected element to be ionized, while the interference from other elements remains negligible. Atom Sciences, having been assigned exclusive commercial rights to the RIS patent by the Department of Energy, has combined RIS with ion sputtering for the analysis of solids. The technique has been named Sputter-Initiated Resonance Ionization Spectroscopy (SIRIS)

Additional details

Publishing Information

Publisher
NLO, Inc.
Imprint Place
Cincinnati, OH (USA)
Imprint Title
Proceedings of the thirtieth annual conference on bioassay, analytical and environmental chemistry
Journal Page Range
vp.

Conference

Title
30. annual conference on bioassay, analytical and environmental chemistry.
Dates
10 Oct 1984.
Place
Cincinnati, OH (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
20034980
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMS; CYCLOTRON RESONANCE; ELEMENTS; EXCITATION; FEASIBILITY STUDIES; ION SPECTROSCOPY; IONIZATION; LASERS; SPUTTERING; US DOE
Descriptors DEC
AMPLIFIERS; ENERGY-LEVEL TRANSITIONS; EQUIPMENT; NATIONAL ORGANIZATIONS; RESONANCE; SPECTROSCOPY; US ORGANIZATIONS