Technique and results of spectroscopy amplifiers testing for semiconductor nuclear radiation detectors
Description
The technique and instrumentation for measuring of general parameters of pr reamplifiers, linear and fast amplifiers, shapers of time keeping intended for p lse height and time measurements when using semiconductor nuclear radiation dete ectors are described. Hoise properties, temperature instability, integral nonlinearity, loading capacity are selected as general parameters for preamplifi iers and linear amplifiers as well as the value of spread of time keering signal for fast amplifiers and shapers is selected two. The results of comparative tes sting of jinr, canberra and rolon units are presented. Standardized measuring devices of common application are used as measurement instrumentation. Possibil lity of properties estimation of selective amplifiers by using the gerenal param ters but not radioactive isotopes, detectors, multichannel analysers is shown. The results of measurements are reproducible casily
Availability note (English)
MF available from INIS under the Report Number.Files
16039278.pdf
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Additional details
Additional titles
- Original title (Russian)
- Методика и результаты испытаний спектрометрических усилителей для полупроводниковых детекторов ядерного излучения
Publishing Information
- Imprint Pagination
- 15 p.
- Report number
- JINR--13-84-54
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 16039278
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BACKGROUND NOISE; BENCH-SCALE EXPERIMENTS; ELECTRIC POTENTIAL; FLOWSHEETS; GAIN; LI-DRIFTED GE DETECTORS; PERFORMANCE; PERFORMANCE TESTING; PREAMPLIFIERS; PULSE AMPLIFIERS; PULSE DISCRIMINATORS; RESOLUTION; SENSITIVITY; TEMPERATURE DEPENDENCE; TIME DEPENDENCE
- Descriptors DEC
- AMPLIFIERS; DIAGRAMS; DISCRIMINATORS; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; GE SEMICONDUCTOR DETECTORS; INFORMATION; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; NOISE; PULSE CIRCUITS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; TESTING
Optional Information
- Notes
- 20 refs.; 13 figs.; 2 tabs.