Functionalization control of porous silicon optical structures using reflectance spectra modeling for biosensing applications
- 1. Universite Europeenne de Bretagne, CNRS-UMR 6082, BP 80518, ENSSAT 6 rue Kerampont, 22305 Lannion Cedex (France)
- 2. Unite de Spectroscopie Raman, Faculte des Sciences de Tunis, 2092 El Manar-Tunisia (Tunisia)
Description
Highlights: → Porous silicon layers with sufficient adjusted pore size and defined porosity. → Biological molecules covalently attached on the modified porous silica surface. → Adjustment of experimental and calculated reflectance spectra to determine volume fraction of biomolecules in functionalized porous silicon structures: single layers and microcavity structures. - Abstract: Modeling and experimental reflectance spectra of porous silicon single layers at different steps of functionalization and protein grafting process are adjusted in order to determine the volume fraction of the biomolecules attached to the internal pore surface. This method is applied in order to control the efficiency of the chemical functionalization process of porous silicon single layers. Using results from single porous silicon layer study, theoretical microcavity is simulated at each step of the functionalization process. The calculated reflectance spectrum is in good agreement to the experimental one. Therefore the single layers study can be applied to multilayer structures and can be adapted for other optical structures such as waveguides, interferometers for biosensing applications.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.mseb.2011.05.040Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2011.05.040;
- PII
- S0921-5107(11)00263-7;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 176
- Journal Issue
- 14
- Journal Page Range
- p. 1047-1053
- ISSN
- 0921-5107
- CODEN
- MSBTEK
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43068058
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- LAYERS; POROSITY; POROUS MATERIALS; SILICON; SIMULATION; SPECTRA; WAVEGUIDES
- Descriptors DEC
- ELEMENTS; MATERIALS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.