Published January 2004
| Version v1
Journal article
Half-life measurement of 79Se with projectile X-ray method in AMS
- 1. China Inst. of Atomic Energy, Beijing (China)
Description
The half-life of 79Se has been measured using the projectile X-ray method in AMS (PX-AMS). A new half-life of 79Se, (2.80 ± 0.36) x 105 a is obtained with the direct measurement method. The half-life of 75Se is also obtained with the same method as that of 79Se. The measurement result of 75Se half-life shows that the result of 79Se half-life obtained with the PX-AMS method is reliable
Additional details
Publishing Information
- Journal Title
- Nuclear Techniques
- Journal Volume
- 27
- Journal Issue
- 1
- Journal Page Range
- p. 22-26
- ISSN
- 0253-3219
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 35052437
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ACCELERATORS; EXPERIMENTAL DATA; HALF-LIFE; MASS SPECTROSCOPY; PROJECTILES; SELENIUM 75; SELENIUM 79; X RADIATION
- Descriptors DEC
- BETA DECAY RADIOISOTOPES; BETA-MINUS DECAY RADIOISOTOPES; DATA; DAYS LIVING RADIOISOTOPES; ELECTROMAGNETIC RADIATION; ELECTRON CAPTURE RADIOISOTOPES; EVEN-ODD NUCLEI; INFORMATION; INTERMEDIATE MASS NUCLEI; INTERNAL CONVERSION RADIOISOTOPES; IONIZING RADIATIONS; ISOMERIC TRANSITION ISOTOPES; ISOTOPES; MINUTES LIVING RADIOISOTOPES; NUCLEI; NUMERICAL DATA; RADIATIONS; RADIOISOTOPES; SELENIUM ISOTOPES; SPECTROSCOPY; YEARS LIVING RADIOISOTOPES