Published 1991 | Version v1
Report Open

X-ray scattering studies of multilayer interfaces

Creators

  • 1. Brookhaven National Lab., Upton, NY (United States)
  • 2. National Inst. of Standards and Technology, Gaithersburg, MD (United States)
  • 3. Brooklyn Coll., NY (United States). Dept. of Physics

Description

The results of specular and diffuse x-ray scattering studies of multilayers are discussed. We show here that such studies can yield detailed statistical information about the interfacial roughness and morphology. Results on a GaAs/AlAs multilayer are presented and the data is analyzed within the Born approximation

Availability note (English)

MF available from INIS under the Report Number; OSTI as DE92007612; NTIS; INIS; US Govt. Printing Office Dep.

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Additional details

Publishing Information

Imprint Pagination
5 p.
Report number
BNL--45048

Conference

Title
Annual fall meeting of the Materials Research Society.
Dates
2-6 Dec 1991.
Place
Boston, MA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
23041393
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM ARSENIDES; BORN APPROXIMATION; BRAGG REFLECTION; CORRELATION FUNCTIONS; GALLIUM ARSENIDES; INTERFACES; LAYERS; ROUGHNESS; SCATTERING; X-RAY DIFFRACTION
Descriptors DEC
ALUMINIUM COMPOUNDS; ARSENIC COMPOUNDS; ARSENIDES; COHERENT SCATTERING; DIFFRACTION; FUNCTIONS; GALLIUM COMPOUNDS; PNICTIDES; REFLECTION; SURFACE PROPERTIES

Optional Information

Contract/Grant/Project number
Contract AC02-76CH00016
Funding organization
USDOE, Washington, DC (United States).
Secondary number(s)
CONF-911202--53.