Published April 11, 2015
| Version v1
Journal article
Beam characterization of a monolithic ΔE/E silicon device
Creators
- 1. Politecnico di Milano, Dipartimento di Energia, Sezione di Ingegneria Nucleare - CeSNEF, via Ponzio 34/3, 20133 Milano (Italy)
- 2. INFN, Sezione di Milano, via Celoria 16, 20133 Milano (Italy)
- 3. INFN, Sezione di Padova, via Marzolo 8, 35131 Padova (Italy)
- 4. Università di Padova, Dipartimento di Fisica e Astronomia, via Marzolo 8, 35131 Padova (Italy)
Description
A full characterization of a ΔE/E monolithic silicon detector especially developed for microdosimetry was performed using monochromatic beams of α-particles and protons at the Italian National Laboratories of Legnaro at the CN van de Graaff accelerator. The investigation was performed in order to evaluate the limitations and the systematic effects affecting its use as a microdosimeter. The results can be extended to the standard use of these kind of devices as particle identifiers
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2014.12.102Additional details
Identifiers
- DOI
- 10.1016/j.nima.2014.12.102;
- PII
- S0168-9002(15)00004-2;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 779
- Journal Page Range
- p. 6-12
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47027380
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAMS; EQUIPMENT; HEAVY IONS; MICRODOSIMETRY; MONOCHROMATIC RADIATION; PROTONS; SI SEMICONDUCTOR DETECTORS; TELESCOPES; VAN DE GRAAFF ACCELERATORS
- Descriptors DEC
- ACCELERATORS; BARYONS; CHARGED PARTICLES; DOSIMETRY; ELECTROMAGNETIC RADIATION; ELECTROSTATIC ACCELERATORS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; IONS; MEASURING INSTRUMENTS; NUCLEONS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.