Published November 2013 | Version v1
Journal article

Theoretical simulation and experimental confirmation of duty cycle effect on stroboscopic white light interferometry for M(O)EMS dynamic characterization

  • 1. Department of Mechanical Engineering, National Taiwan University, No. 1, Sec. 4 Roosevelt Rd., Taipei 106, Taiwan (China)
  • 2. Graduate Institute of Automation Technology, National Taipei University of Technology, No. 1, Sec. 3, Zhong Hsiao East Rd., Taipei 106, Taiwan (China)

Description

Stroboscopic white light interferometry (SWLI) has been known as a useful measurement technique for vibrating samples such as micro-electro-mechanical systems (MEMS) or micro-opto-electro-mechanical systems (M(O)EMS) because it enables dynamic mode reconstruction and characterization of the tested system. An approximate model simulation without any experimental confirmation previously indicated that the duty cycle of the light could reduce the accuracy of the measurement. To provide a comprehensive insight into this important phenomenon, the study investigated theoretically and experimentally the effect of duty cycle of the light. An atomic force microscopy cantilever beam vibrating at its second resonant frequency was measured and the experimental measurements were analyzed and compared with the simulated results. In general, a reasonable correspondence between the mathematical model and the experimental measurements has been observed when the duty cycle is less than 15% and the average deviation is kept within 15.4% of the vibration amplitude. However, it is verified that the SWLI using white light LED has its physical detection limits when the cycle time of the strobed light or the light exposure time of the imaging device is more than 20%, in which the maximum measured error can significantly exceed 38.4% of the vibration amplitude. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0960-1317/23/11/115008

Additional details

Publishing Information

Journal Title
Journal of Micromechanics and Microengineering. Structures, Devices and Systems
Journal Volume
23
Journal Issue
11
Journal Page Range
[10 p.]
ISSN
0960-1317
CODEN
JMMIEZ

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47053848
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ACCURACY; AMPLITUDES; ATOMIC FORCE MICROSCOPY; BEAMS; COMPARATIVE EVALUATIONS; ERRORS; INTERFEROMETRY; MATHEMATICAL MODELS; MEMS; SENSITIVITY; SIMULATION
Descriptors DEC
EVALUATION; MICROSCOPY